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1 low power rtc with battery backed sram, integrated 5ppm temperature compensation and auto daylight saving ISL12022M the ISL12022M device is a low power real time clock (rtc) with an embedded temperature sensor and crystal. device functions include oscillator compensation, clock/calendar, power fail and low battery monitors, brownout indicator, one-time, periodic or polled alarms, intelligent battery backup switching, battery reseal? function and 128 bytes of battery-backed user sram. backup battery current draw is less than 1.6a over the temperature range. the device is offered in a 20 ld soic module that contains the rtc and an embedded 32.768khz quartz crystal. the calibrated oscillator provides less than 5ppm drift over the full -40c to +85c temperature range. the rtc tracks time with separate registers for hours, minutes, and seconds. the calendar regist ers track date, month, year and day of the week and are accurate through 2099, with automatic leap year correction. daylight savings time adjustment is done automatically, using parameters entered by the user. power fail and battery monitors offer user-selectable trip levels. the time stamp function records the time and date of switchover from v dd to v bat power, and also from v bat to v dd power. related literature ?see an1549 ?addressing power issues in real time clock applications? features ? embedded 32.768khz quartz crystal in the package ? 20 ld soic package (for dfn version, refer to the isl12020m) ?calendar ? on-chip oscillator temperature compensation ? 10-bit digital temperature sensor output ? 15 selectable frequency outputs ? interrupt for alarm or 15 selectable frequency outputs ? automatic backup to battery or supercapacitor ?v dd and battery status monitors ? battery reseal? function to extend battery shelf life ? power status brownout monitor ? time stamp for battery switchover ? 128 bytes battery-backed user sram ? 1.6a max battery current ?i 2 c-bus? ? rohs compliant applications ? utility meters ?pos equipment ? printers and copiers ? digital cameras figure 1. typical application circuit figure 2. oscillator error vs temperature nc 1 nc 2 nc 3 nc 4 nc 5 gnd 6 v bat 7 gnd 8 nc 9 nc 10 sda 11 scl 12 irq / 13 v dd 14 ISL12022M gnd 15 nc 16 nc 17 nc 18 nc 19 nc 20 3.3v r1 10k r2 10k r3 10k c1 0.1f bat54 sda scl mcu gnd interface v dd battery 3.0v c2 0.1f schottky diode irq /f out f out -5 -4 -3 -2 -1 0 1 2 3 4 5 -40-200 20406080 temperature (c) f out frequency error (ppm) v dd = 2.7v v bat = 5.5v v dd = 3.3v june 20, 2012 fn6668.9 caution: these devices are sensitive to electrostatic discharge; follow proper ic handling procedures. 1-888-intersil or 1-888-468-3774 | copyright intersil americas inc. 2008-2012. all rights reserved intersil (and design) and battery reseal are trademarks ow ned by intersil corporation or one of its subsidiaries. i 2 c bus is a trademark owned by nxp semiconductors netherlands, b.v. all other trademarks mentioned are the property of their respective owners.
ISL12022M 2 fn6668.9 june 20, 2012 block diagram pin configuration ISL12022M (20 ld soic) top view i 2 c interface control logic alarm frequency out rtc divider sda buffer crystal oscillator por switch scl buffer sda scl v dd v bat internal supply v trip seconds minutes hours day of week date month year user sram control registers gnd registers temperature sensor frequency control irq /f out + - nc nc nc gnd nc nc 1 2 3 4 5 6 7 8 9 10 20 19 18 17 16 15 14 13 12 11 nc nc gnd v dd nc nc gnd v bat nc nc nc irq /f out scl sda pin descriptions pin number symbol description 1, 2, 3, 4, 5, 9, 10, 16, 17, 18, 19, 20 nc no connection . do not connect to a signal or supply voltage. 7v bat backup supply . this input provides a backup supply voltage to the device. v bat supplies power to the device in the event that the v dd supply fails. this pin can be connected to a battery, a supercapacitor or tied to ground if not used. see the battery monitor parameter in ?dc operating characteristics rtc? on page 5. this pin should be tied to ground if not used. 11 sda serial data . sda is a bi-directional pin used to transfer data into and out of the device. it has an open drain output and may be or?ed with other open drain or open collector outputs. the input buffer is always active (not gated) in normal mode. an open drain output requires the use of a pull-up resistor. the output circuitry controls the fa ll time of the output signal with the use of a slope controlled pull-d own. the circuit is designed for 400khz i 2 c interface speeds. it is disabled when the backup power supply on the v bat pin is activated.
ISL12022M 3 fn6668.9 june 20, 2012 12 scl serial clock . the scl input is used to clock all serial data into and out of the device. the input buffer on this pin is always active (not gated). it is disabled when the backup power supply on the v bat pin is activated to minimize power consumption. 13 irq /f out interrupt output/frequency output (default 32.768khz frequency output) . this dual function pin can be used as an interrupt or frequency output pin. the irq /fout mode is selected via the frequency out control bits of the control/status register. interrupt mode . the pin provides an interrupt signal output. this signal notifies a host processor that an alarm has occurred and requests action. it is an open drain active low output. frequency output mode . the pin outputs a clock signal, which is related to the crystal frequency. the frequency output is user selectable and enabled via the i 2 c bus. it is an open drain output. the output is open drain and requires a pull-up resistor. 14 v dd power supply . chip power supply and ground pins. the device will operate with a power supply from v dd = 2.7v to 5.5vdc. a 0.1f capacitor is recommended on the v dd pin to ground. 6, 8, 15 gnd ground pin pin descriptions (continued) pin number symbol description ordering information part number (notes 1, 2, 3) part marking v dd range (v) temp range (c) package (rohs compliant) pkg. dwg. # ISL12022Mibz ISL12022Mibz 2.7 to 5.5 -40 to +85 20 ld soic m20.3 notes: 1. add ?-t*? suffix for tape and reel. please refer to tb347 for details on reel specifications. 2. these intersil plastic packaged products employ special material sets, molding comp ounds and 100% matte tin plate plus anneal (e3) termination finish. these products do contain pb but they are rohs compliant by exemption 7 (lead in high melt temp solder for internal con nections) and exemption 5 (lead in piezoelectric elements). these intersil rohs compliant products are compatible with both snpb and pb-free soldering operations. these intersil rohs compliant pr oducts are msl classified at pb-free peak re flow temperatures that meet or exceed t he pb-free requirements of ipc/jedec j std-020. 3. for moisture sensitivity level (msl), please see device information page for ISL12022M . for more information on msl please see techbrief tb363 .
ISL12022M 4 fn6668.9 june 20, 2012 table of contents absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 thermal information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 dc operating characteristics rtc . . . . . . . . . . . . . . . . . . . . . 5 power-down timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 i 2 c interface specifications. . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 sda vs scl timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 symbol table. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 typical performance curves . . . . . . . . . . . . . . . . . . . . . . . . . . 9 general description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 power control operation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 normal mode (v dd ) to battery backup mode (v bat ) . . . . . . 11 battery backup mode (v bat ) to normal mode (v dd ) . . . . . . 11 power failure detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 brownout detection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 battery level monitor . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 real time clock operation . . . . . . . . . . . . . . . . . . . . . . . . . . .12 single event and interrupt . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 frequency output mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 general purpose user sram . . . . . . . . . . . . . . . . . . . . . . . . . . 12 i 2 c serial interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 oscillator compensation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 register descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12 real time clock registers . . . . . . . . . . . . . . . . . . . . . . . . . . .14 addresses [00h to 06h] . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 control and status registers (csr) . . . . . . . . . . . . . . . . . . .14 addresses [07h to 0fh]. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 interrupt control register (int) . . . . . . . . . . . . . . . . . . . . . . . . 15 power supply control register (pwr_vdd) . . . . . . . . . . . . . . 16 battery voltage trip voltage regi ster (pwr_vbat) . . . . . . . 16 initial at and dt setting register (itro) . . . . . . . . . . . . . . . . 17 alpha register (alpha) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 beta register (beta) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 final analog trimming register (fatr) . . . . . . . . . . . . . . . . . 20 final digital trimming re gister (fdtr). . . . . . . . . . . . . . . . . . 20 alarm registers (10h to 15h) . . . . . . . . . . . . . . . . . . . . . . . . 20 time stamp vdd to battery registers (tsv2b) . . . . . . . . . . . 21 time stamp battery to vdd registers (tsb2v) . . . . . . . . . . . 21 dst control registers (dstcr) . . . . . . . . . . . . . . . . . . . . . . . . 21 temp registers (temp). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 nppm registers (nppm) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 xt0 registers (xt0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 alpha hot register (alphah). . . . . . . . . . . . . . . . . . . . . . . . . 23 user registers (accessed by using slave address 1010111x). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 addresses [00h to 7fh] . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 i 2 c serial interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 protocol conventions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 device addressing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 write operation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 read operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 application section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 power supply considerations . . . . . . . . . . . . . . . . . . . . . . . . . 26 battery backup details . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 layout considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 measuring oscillator accuracy . . . . . . . . . . . . . . . . . . . . . . . . 27 temperature compensation operation . . . . . . . . . . . . . . . . . 27 daylight savings time (dst) example . . . . . . . . . . . . . . . . . . 27 revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 products . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 package outline drawing . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
ISL12022M 5 fn6668.9 june 20, 2012 absolute maximum rating s thermal information voltage on v dd , v bat and irq /f out pins (respect to ground) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3v to 6.0v voltage on scl and sda pins (respect to ground) . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3v to v dd +0.3v esd rating human body model (per mil-std-883 method 3014) . . . . . . . . . . >3kv machine model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300v charged device model . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .>2200v latch-up (tested per jesd-78b, class 2, level a . . . . . . . . . . . . . . . 100ma shock resistance . . . . . . . . . . . . . . . . . . . . . . . . . . . 5000g, 0.3ms, 1/2 sine vibration (ultrasound clea ning not advised) . . . . . . . . . . 20g/10-2000hz thermal resistance (typical) ja (c/w) jc (c/w) 20 lead soic (notes 4, 5) . . . . . . . . . . . . . . 70 35 storage temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -40c to +85c pb-free reflow profile (note 6). . . . . . . . . . . . . . . . . . . . . . . . see link below http://www.intersil.com/ pbfree/pb-freereflow.asp caution: do not operate at or near the maximum ratings listed for extended periods of time. exposure to such conditions may adv ersely impact product reliability and result in failures not covered by warranty. notes: 4. ja is measured with the component mounted on a high effective thermal conductivity test board in free air. see tech brief tb379 for details. 5. for jc , the ?case temp? location is on top of the package and me asured in the center of the package between pins 6 and 15. 6. the ISL12022M oscillator initial accuracy can change after solder reflow attachment. the amount of change will depend on the reflow temperature and length of exposure. a general rule is to use only one reflow cycle and keep the temperature and time as short as possible. changes on the order of 1ppm to 3ppm can be expected with typical reflow profiles. dc operating characteristics rtc test conditions: v dd = +2.7 to +5.5v, t a = -40c to +85c, unless otherwise stated. boldface limits apply over the operating temperature range, -40c to +85c. symbol parameter conditions min (note 7) typ (note 8) max (note 7) units notes v dd main power supply (note 15) 2.7 5.5 v v bat battery supply voltage (note 15) 1.8 5.5 v9 i dd1 supply current. (i 2 cnotactive, temperature conversion not active, f out not active) v dd = 5v 4.1 15 a 10, 11 v dd = 3v 3.5 14 a 10, 11 i dd2 supply current. (i 2 c active, temperature conversion not active, f out not active) v dd = 5v 200 500 a 10, 11 i dd3 supply current. (i 2 cnotactive, temperature conversion active, f out not active) v dd = 5v 120 400 a 10, 11 i bat battery supply current v dd = 0v, v bat = 3v, t a = +25c 1.0 1.6 a 10 v dd = 0v, v bat = 3v 1.0 5.0 a 10 i batlkg battery input leakage v dd = 5.5v, v bat = 1.8v 100 na i li input leakage current on scl v il = 0v, v ih = v dd -1.0 0.1 1.0 a i lo i/o leakage current on sda v il = 0v, v ih = v dd -1.0 0.1 1.0 a v batm battery level monitor threshold -100 +100 mv v pbm brownout level monitor threshold -100 +100 mv v trip v bat mode threshold (note 15) 2.0 2.2 2.4 v v triphys v trip hysteresis 30 mv 13 v bathys v bat hysteresis 50 mv 13
ISL12022M 6 fn6668.9 june 20, 2012 oscillator accuracy fout i oscillator initial accuracy v dd = 3.3v -2 +8 ppm 6, 17 fout r oscillator accuracy after reflow cycle v dd = 3.3v 5 ppm 6, 17 fout t oscillator stability vs temperature v dd = 3.3v 2 ppm 6, 18 fout v oscillator stability vs voltage 2.7v v dd 5.5v -3 +3 ppm 19 temp temperature sensor accuracy v dd = v bat = 3.3v 2 c 13 irq /f out (open drain output) v ol output low voltage v dd = 5v, i ol = 3ma 0.4 v v dd = 2.7v, i ol = 1ma 0.4 v dc operating characteristics rtc test conditions: v dd = +2.7 to +5.5v, t a = -40c to +85c, unless otherwise stated. boldface limits apply over the operating temperature range, -40c to +85c. (continued) symbol parameter conditions min (note 7) typ (note 8) max (note 7) units notes power-down timing test conditions: v dd = +2.7 to +5.5v, temperature = -40c to +85c, unless otherwise stated. symbol parameter conditions min (note 7) typ (note 8) max (note 7) units notes v ddsr- v dd negative slew rate 10 v/ms 12 v ddsr+ v dd positive slew rate, minimum 0.05 v/ms 16 i 2 c interface specifications test conditions: v dd = +2.7 to +5.5v, temperature = -40c to +85c, unless otherwise specified. boldface limits apply over the operating temperature range, -40c to +85c. symbol parameter test conditions min (note 7) typ (note 8) max (note 7) units notes v il sda and scl input buffer low voltage -0.3 0.3 x v dd v v ih sda and scl input buffer high voltage 0.7 x v dd v dd + 0.3 v hysteresis sda and scl input buffer hysteresis 0.05 x v dd v13, 14 v ol sda output buffer low voltage, sinking 3ma v dd = 5v, i ol = 3ma 0 0.02 0.4 v c pin sda and scl pin capacitance t a = +25c, f = 1mhz, v dd = 5v, v in =0v, v out = 0v 10 pf 13, 14 f scl scl frequency 400 khz t in pulse width suppression time at sda and scl inputs any pulse narrower than the max spec is suppressed. 50 ns t aa scl falling edge to sda output data valid scl falling edge crossing 30% of v dd , until sda exits the 30% to 70% of v dd window. 900 ns t buf time the bus must be free before the start of a new transmission sda crossing 70% of v dd during a stop condition, to sda crossing 70% of v dd during the following start condition. 1300 ns t low clock low time measured at the 30% of v dd crossing. 1300 ns t high clock high time measured at the 70% of v dd crossing. 600 ns
ISL12022M 7 fn6668.9 june 20, 2012 t su:sta start condition setup time scl rising edge to sda falling edge. both crossing 70% of v dd . 600 ns t hd:sta start condition hold time from sda falling edge crossing 30% of v dd to scl falling edge crossing 70% of v dd . 600 ns t su:dat input data setup time from sda exiting the 30% to 70% of v dd window, to scl rising edge crossing 30% of v dd. 100 ns t hd:dat input data hold time from scl falling edge crossing 30% of v dd to sda entering the 30% to 70% of v dd window. 20 900 ns t su:sto stop condition setup time from scl rising edge crossing 70% of v dd , to sda rising edge crossing 30% of v dd . 600 ns t hd:sto stop condition hold time from sda rising edge to scl falling edge. both crossing 70% of v dd . 600 ns t dh output data hold time from scl falling edge crossing 30% of v dd , until sda enters the 30% to 70% of v dd window. 0 ns t r sda and scl rise time from 30% to 70% of v dd. 20 + 0.1 x cb 300 ns 13, 14 t f sda and scl fall time from 70% to 30% of v dd. 20 + 0.1 x cb 300 ns 13, 14 cb capacitive loading of sda or scl total on-chip and off-chip 10 400 pf 13, 14 r pu sda and scl bus pull-up resistor off-chip maximum is determined by t r and t f . for cb = 400pf, max is about 2k ? ~2.5k ? . for cb = 40pf, max is about 15k ? ~20k ? 1 k ? 13, 14 notes: 7. parameters with min and/or ma x limits are 100% tested at +25c, unless othe rwise specified. temperat ure limits established by characterization and are not production tested. 8. specified at +25c. 9. temperature conversion is inactive below v bat = 2.7v. device operation is not guaranteed at v bat <1.8v. 10. irq/ f out inactive. 11. v dd > v bat +v bathys 12. in order to ensure proper timekeeping, the v dd sr- specification must be followed. 13. limits should be considered typical and are not production tested. 14. these are i 2 c specific parameters and are not tested, however, they are used to set conditions for testing devices to validate specificatio n. 15. minimum v dd and/or v bat of 1v to sustain the sram. the value is base d on characterization and it is not tested. 16. to avoid eeprom recall issues, it is advised to use this minimum power up slew rate. not tested, shown as typical only. 17. defined as the deviation from a target oscill ator frequency of 32,768.0hz at room temperature. 18. defined as the deviation from the room temperature measured 1hz frequency, v dd = 3.3v, at t a = -40c to +85c. 19. defined as the deviation at room temperature from the measured 1hz frequency (or equivalent) at v dd = 3.3, over the range of v dd = 2.7v to v dd =5.5v. i 2 c interface specifications test conditions: v dd = +2.7 to +5.5v, temperature = -40c to +85c, unless otherwise specified. boldface limits apply over the operating temperature range, -40c to +85c. (continued) symbol parameter test conditions min (note 7) typ (note 8) max (note 7) units notes
ISL12022M 8 fn6668.9 june 20, 2012 sda vs scl timing symbol table t su:sto t dh t high t su:sta t hd:sta t hd:dat t su:dat scl sda (input timing) sda (output timing) t f t low t buf t aa t r figure 3. standard output load for testing the device with v dd = 5.0v sda and irq /f out 1533 100pf 5.0v for v ol = 0.4v and i ol = 3ma equivalent ac output load circuit for v dd = 5v waveform inputs outputs must be steady will be steady may change from low to high will change from low to high may change from high to low will change from high to low don?t care: changes allowed changing: state not known n/a center line is high impedance
ISL12022M 9 fn6668.9 june 20, 2012 typical performance curves temperature is +25c unless otherwise specified. figure 4. i bat vs v bat (v dd = 0v) figure 5. i bat vs temperature (v dd = 0v) figure 6. i dd1 vs temperature figure 7. i dd1 vs v dd figure 8. oscillator error vs temperature figure 9. f out vs i dd 800 850 900 950 1000 1050 1.8 2.3 2.8 3.3 3.8 4.3 4.8 5.3 v bat voltage (v) v bat current (na) 600 800 1000 1200 1400 1600 -40 -20 0 20 40 60 80 temperature (c) i bat (na) v bat = 1.8v v bat = 3.0v v bat = 5.5v 2 3 4 5 6 -40-200 20406080 temperature (c) i dd1 (a) v dd = 3.3v v dd = 2.7v v dd = 5.5v 3.0 3.2 3.4 3.6 3.8 4.0 4.2 4.4 2.7 3.2 3.7 4.2 4.7 5.2 v dd (v) i dd1 (a) -5 -4 -3 -2 -1 0 1 2 3 4 5 -40-200 20406080 temperature (c) f out frequency error (ppm) v dd = 2.7v v bat = 5.5v v dd = 3.3v 2 3 4 5 6 0.01 0.1 1 10 100 1k 10k 1m frequency output (hz) i dd (a) v dd = 2.7v v bat = 5.5v v dd = 3.3v
ISL12022M 10 fn6668.9 june 20, 2012 general description the ISL12022M device is a low power real time clock (rtc) with embedded temperature sensor and crystal. it contains crystal frequency compensation circuitry over the operating temperature range good to 5ppm accuracy. it also contains a clock/calendar with daylight savings time (dst ) adjustment, power fail and low battery monitors, brownout indicator, 1 periodic or polled alarm, intelligent battery backup switching and 128 bytes of battery- backed user sram. the oscillator uses an internal 32.768khz crystal. the real time clock tracks time with separate registers for hours, minutes and seconds. the device has calendar registers for date, month, year and day of the week. the calendar is accurate through 2099, with automatic leap year correct ion. in addition, the ISL12022M can be programmed for automati c daylight saving time (dst) adjustment by entering local dst information. the ISL12022M?s alarm can be set to any clock/calendar value for a match. for example, every minute, every tuesday or at 5:23 am on march 21. the alarm status is available by checking the status register, or the device can be configured to provide a hardware interrupt via the irq /f out pin. there is a repeat mode for the alarm allowing a periodic in terrupt every minute, every hour, every day, etc. the device also offers a backup power input pin. this v bat pin allows the device to be backed up by battery or supercapacitor with automatic switchover from v dd to v bat . the ISL12022M device is specified for v dd = 2.7v to 5.5v and the clock/calendar portion of the device remains fully operational in battery backup mode down to 1.8v (standby mode). the v bat level is monitored and reported against preselected levels. the first report is registered when the v bat level falls below 85% of nominal level; the second level is set for 75%. battery levels are stored in pwr_vbat registers. the ISL12022M offers a ?brownout? alarm once the v dd falls below a pre-selected trip level. th is allows system micro to save vital information to memory before complete power loss. there are six v dd levels that could be selected for initiation of the brownout alarm. figure 10. i dd vs temperature, 3 different f out figure 11. i bat with tse = 1, btse = 1 vs temperature figure 12. i dd with tse = 1 vs temperature figure 13 . oscillator change vs temperature at different aging settings (iatr) (beta set for 1ppm steps) typical performance curves temperature is +25c unless otherwise specified. (continued) 2.5 3.0 3.5 4.0 4.5 5.0 5.5 -40-200 20406080 temperature (c) supply current (a) f out = 32khz f out = 64hz f out = 1hz 20 30 40 50 60 70 80 90 100 110 -40-200 20406080 temperature (c) i bat (a) v dd = 1.8v v bat = 5.5v v dd = 3.0v 40 50 60 70 80 90 100 110 -40 -20 0 20 40 60 80 temperature (c) i dd (a) v dd = 2.7v v bat = 5.5v v dd = 3.3v -80 -60 -40 -20 0 20 40 60 80 -40-200 20406080 temperature (c) frequency change (ppm) 62.5ppm 32ppm -31ppm -61.5ppm 0ppm
ISL12022M 11 fn6668.9 june 20, 2012 functional description power control operation the power control circuit accepts a v dd and a v bat input. many types of batteries can be used with intersil rtc products. for example, 3.0v or 3.6v lithium batteries are appropriate, and battery sizes are available that can power the ISL12022M for up to 10 years. another option is to use a supercapacitor for applications where v dd is interrupted for up to a month. see the ?application section? on page 26 for more information. normal mode (v dd ) to battery backup mode (v bat ) to transition from the v dd to v bat mode, both of the following conditions must be met: condition 1: v dd < v bat - v bathys where v bathys 50mv condition 2: v dd < v trip where v trip 2.2v battery backup mode (v bat ) to normal mode (v dd ) the ISL12022M device will switch from the v bat to v dd mode when one of the following conditions occurs: condition 1: v dd > v bat + v bathys where v bathys 50mv condition 2: v dd > v trip + v triphys where v triphys 30mv these power control situations are illustrated in figures 14 and 15. the i 2 c bus is deactivated in battery backup mode to reduce power consumption. aside from this, all rtc functions are operational during battery backup mode. except for scl and sda, all the inputs and outputs of the ISL12022M are active during battery backup mode unless disabled via the control register. the device time stamps the switchover from v dd to v bat and v bat to v dd , and the time is stored in t sv2b and t sb2v registers respectively. if multiple v dd power-down sequences occur before the status is read, the earliest v dd to v bat power-down time is stored and the most recent v bat to v dd time is stored. temperature conversion and compensation can be enabled in battery backup mode. bit btse in the beta register controls this operation, as described in ?beta register (beta)? on page 18. power failure detection the ISL12022M provides a real time clock failure bit (rtcf) to detect total power failure. it allows users to determine if the device has powered up after having lost all power to the device (both v dd and v bat ). brownout detection the ISL12022M monitors the v dd level continuously and provides warning if the v dd level drops below prescribed levels. there are six (6) levels that can be selected for the trip level. these values are 85% below popular v dd levels. the lvdd bit in the status register will be set to ?1? when brownout is detected. note that the i 2 c serial bus remains active unless the battery v trip levels are reached. battery level monitor the ISL12022M has a built-in warn ing feature once the backup battery level drops first to 85% and then to 75% of the battery?s nominal v bat level. when the battery voltage drops to between 85% and 75%, the lbat85 bit is se t in the status register. when the level drops below 75%, both lbat85 and lbat75 bits are set in the status register. the battery level monitor is not functional in battery backup mode. in order to read the monitor bits after powering up v dd , instigate a battery level measurement by setting the tse bit to "1" (beta register), and then read the bits. there is a battery time stamp fu nction available. once the v dd is low enough to enable switchover to the battery, the rtc time/date are written into the tsv2b register. this information can be read from the tsv2b registers to discover the point in time of the v dd power-down. if there are multip le power-down cycles before reading these registers, the first values stored in these registers will be retained. these registers will hold the original power-down value until they are cleared by setting clrts = 1 to clear the registers. the normal power switching of the ISL12022M is designed to switch into battery backup mode only if the v dd power is lost. v bat - v bathys v bat v bat + v bathys battery backup mode v dd v trip 2.2v 1.8v figure 14. battery switchover when v bat v trip v trip v bat v trip + v triphys battery backup mode v dd v trip 3.0v 2.2v
ISL12022M 12 fn6668.9 june 20, 2012 this will ensure that the devi ce can accept a wide range of backup voltages from many ty pes of sources while reliably switching into backup mode. note that the ISL12022M is no t guaranteed to operate with v bat < 1.8v. if the battery voltage is expected to drop lower than this minimum, correct operation of the device, (especially after a v dd power-down cycle) is not guaranteed. the minimum v bat to insure sram is stab le is 1.0v. below that, the sram may be corrupted when v dd power resumes. real time clock operation the real time clock (rtc) uses an integrated 32.768khz quartz crystal to maintain an accurate internal representation of second, minute, hour, day of week, date, month, and year. the rtc also has leap-year correction. the clock also corrects for months having fewer than 31 days and has a bit that controls 24-hour or am/pm format. when the ISL12022M powers up after the loss of both v dd and v bat , the clock will not begin incrementing until at least one byte is written to the clock register. single event and interrupt the alarm mode is enabled via the msb bit. choosing single event or interrupt alarm mode is selected via the im bit. note that when the frequency output function is enabled, the alarm function is disabled. the standard alarm allows for alarms of time, date, day of the week, month, and year. when a time alarm occurs in single event mode, the irq /f out pin will be pulled low and the alarm status bit (alm) will be set to ?1?. the pulsed interrupt mode allows for repetitive or recurring alarm functionality. hence, once the alarm is set, the device will continue to alarm for each occurring match of the alarm and present time. thus, it will alarm as often as every minute (if only the nth second is set) or as infreq uently as once a year (if at least the nth month is set). during pulsed interrupt mode, the irq /f out pin will be pulled low for 250ms and the alarm status bit (alm) will be set to ?1?. the alm bit can be reset by the user or cleared automatically using the auto reset mode (see ar st bit). the alarm function can be enabled/disabled during ba ttery backup mode using the fobatb bit. for more information on the alarm, please see ?alarm registers (10h to 15h)? on page 20. frequency output mode the ISL12022M has the option to provide a clock output signal using the irq /f out open drain output pin. the frequency output mode is set by using the fo bits to select 15 possible output frequency values from 1/32hz to 32khz. the frequency output can be enabled/disabled during battery backup mode using the fobatb bit. general purpose user sram the ISL12022M provides 128 bytes of user sram. the sram will continue to operate in battery backup mode. however, it should be noted that the i 2 c bus is disabled in battery backup mode. i 2 c serial interface the ISL12022M has an i 2 c serial bus interface that provides access to the control and status registers and the user sram. the i 2 c serial interface is compatible with other industry i 2 c serial bus protocols using a bi-directional data signal (sda) and a clock signal (scl). oscillator compensation the ISL12022M provides both initial timing correction and temperature correction due to vari ation of the crystal oscillator. analog and digital trimming control is provided for initial adjustment, and a temperature compensation function is provided to automatically correct for temperat ure drift of the crystal. initial values for the initial at and dt settings (itr0), temperature coefficient (alpha), crystal capacitance (beta), as well as the crystal turn-over temperature (xto ), are preset internally and recalled to ram registers on power-up. the compensation function can be enabled/disabled at any time and can be used in battery mode as well. register descriptions the battery-backed registers are accessible following a slave byte of ?1101111x? and reads or wr ites to addresses [00h:2fh]. the defined addresses and default values are described in table 1. the battery backed general purpose sram has a different slave address (1010111x), so it is not possible to read/write that section of memo ry while accessing the registers. register access the contents of the registers can be modified by performing a byte or a page write operation directly to any register address. the registers are divided into 8 sections. they are: 1. real time clock (7 bytes): address 00h to 06h. 2. control and status (9 bytes): address 07h to 0fh. 3. alarm (6 bytes): address 10h to 15h. 4. time stamp for battery status (5 bytes): address 16h to 1ah. 5. time stamp for v dd status (5 bytes): address 1bh to 1fh. 6. day light saving time (8 bytes): 20h to 27h. 7. temp (2 bytes): 28h to 29h. 8. crystal net ppm correction, nppm (2 bytes): 2ah, 2bh 9. crystal turnover temperature, xt0 (1 byte): 2ch 10. crystal alpha at high temper ature, alpha_h (1 byte): 2dh 11. scratch pad (2 bytes): address 2eh and 2fh write capability is allowable into the rtc registers (00h to 06h) only when the wrtc bit (bit 6 of address 08h) is set to ?1?. a multi-byte read or write operation should be limited to one section per operation for best rtc time keeping performance. a register can be read by perf orming a random read at any address at any time. this returns the contents of that register location. additional registers are read by performi ng a sequential read. for the rtc and alarm regi sters, the read instruction latches all clock registers into a buffer, so an update of the clock does not change the time being read. at the end of a read, the master supplies a stop condition to end the operation and free
ISL12022M 13 fn6668.9 june 20, 2012 the bus. after a read, the addr ess remains at the previous address +1 so the user can execute a current address read and continue reading the next register . when the previous address is 2fh, the next address will wrap around to 00h. it is not necessary to set the wrtc bit prior to writing into the control and status, alarm, and user sram registers. table 1. register memory map (yellow shading indicates read-only bits) addr. section reg name bit range default 76543210 00h rtc sc 0 sc22 sc21 sc20 sc13 sc12 sc11 sc10 0 to 59 00h 01h mn 0 mn22 mn21 mn20 mn13 mn12 mn11 mn10 0 to 59 00h 02h hr mil 0 hr21 hr20 hr13 hr12 hr11 hr10 0 to 23 00h 03h dt 0 0 dt21 dt20 dt13 dt12 dt11 dt10 1 to 31 01h 04h mo 0 0 0 mo20 mo13 mo12 mo11 mo10 1 to 12 01h 05h yr yr23 yr22 yr21 yr20 yr13 yr12 yr11 yr10 0 to 99 00h 06h dw 0 0 0 0 0 dw2 dw1 dw0 0 to 6 00h 07h csr sr busy oscf dstadj alm lvdd lbat85 lbat75 rtcf n/a 01h 08h int arst wrtc im fobatb fo3 fo2 fo1 fo0 n/a 01h 09h pwr_vdd clrts d d d d v dd trip2 v dd trip1 v dd trip0 n/a 00h 0ah pwr_vbat d resealb vb85tp2 vb85tp1 vb85tp0 vb75tp2 vb75tp1 vb75tp0 n/a 00h 0bh itro idtr01 idtr00 iatr05 iatr04 iatr03 iatr02 iatr01 iatr00 n/a xxh 0ch alpha d alpha6 alpha5 alpha4 alpha3 alpha2 alpha1 alpha0 n/a xxh 0dh beta tse btse btsr beta4 beta3 beta2 beta1 beta0 n/a xxh 0eh fatr 0 0 ffatr5 fatr4 fatr3 fatr2 fatr1 fatr0 n/a 00h 0fh fdtr 0 0 0 fdtr4 fdtr3 fdtr2 fdtr1 fdtr0 n/a 00h 10h alarm sca0 esca0 sca022 sca021 sca020 sca013 sca012 sca011 sca010 00 to 59 00h 11h mna0 emna0 mna022 mna021 mna020 mna0 13 mna012 mna011 mna010 00 to 59 00h 12h hra0 ehra0 d hra021 hra020 hra013 hra012 hra011 hra010 0 to 23 00h 13h dta0 edta0 d dta021 dta020 dta013 dta012 dta011 dta010 01 to 31 00h 14h moa0 emoa00 d d moa020 moa013 moa012 moa011 moa010 01 to 12 00h 15h dwa0 edwa0 d d d d dwa02 dwa01 dwa00 0 to 6 00h 16h tsv2b vsc 0 vsc22 vsc21 vsc20 vsc13 vsc12 vsc11 vsc10 0 to 59 00h 17h vmn 0 vmn22 vmn21 vmn20 vmn13 vmn12 vmn11 vmn10 0 to 59 00h 18h vhr vmil 0 vhr21 vhr20 vhr13 vhr12 vhr11 vhr10 0 to 23 00h 19h vdt 0 0 vdt21 vdt20 vdt13 vdt12 vdt11 vdt10 1 to 31 00h 1ah vmo 0 0 0 vmo20 vmo13 vmo12 vmo11 vmo10 1 to 12 00h 1bh tsb2v bsc 0 bsc22 bsc21 bsc20 bsc13 bsc12 bsc11 bsc10 0 to 59 00h 1ch bmn 0 bmn22 bmn21 bmn20 bmn13 bmn12 bmn11 bmn10 0 to 59 00h 1dh bhr bmil 0 bhr21 bhr20 bhr13 bhr12 bhr11 bhr10 0 to 23 00h 1eh bdt 0 0 bdt21 bdt20 bdt13 bdt12 bdt11 bdt10 1 to 31 00h 1fh bmo 0 0 0 bmo20 bmo13 bmo12 bmo11 bmo10 1 to 12 00h
ISL12022M 14 fn6668.9 june 20, 2012 real time clock registers addresses [00h to 06h] rtc registers (sc, mn, hr, dt, mo, yr, dw) these registers depict bcd representations of the time. as such, sc (seconds) and mn (minutes) range from 0 to 59, hr (hour) can either be a 12-hour or 24-hour mode, dt (date) is 1 to 31, mo (month) is 1 to 12, yr (year) is 0 to 99, and dw (day of the week) is 0 to 6. the dw register provides a day of the week status and uses three bits (dw2 to dw0) to represent the seven days of the week. the counter advances in the cycle 0-1-2-3-4-5-6-0-1-2-? the assignment of a numerical value to a specific day of the week is arbitrary and may be decided by the system software designer. the default value is defined as ?0?. 24-hour time if the mil bit of the hr register is ?1?, the rtc uses a 24-hour format. if the mil bit is ?0?, the rtc uses a 12-hour format and hr21 bit functions as an am/pm indicator with a ?1? representing pm. the clock defaults to 12-hour format time with hr21 = ?0?. leap years leap years add the day february 29 and are defined as those years that are divisible by 4. years divi sible by 100 are not leap years, unless they are also divisible by 400. this means that the year 2000 is a leap year and the year 2100 is not. the ISL12022M does not correct for the leap year in the year 2100. control and status registers (csr) addresses [07h to 0fh] the control and status registers consist of the status register, interrupt and alarm register, analog trimming and digital trimming registers. status register (sr) the status register is located in the memory map at address 07h. this is a volatile register that provides either control or status of rtc failure (rtcf), battery level monitor (lbat85, lbat75), alarm trigger, daylight saving time, crystal oscillator enable and temperature conv ersion in progress bit. busy bit (busy) busy bit indicates temperature sensing is in progress. in this mode, alpha, beta and itro registers are disabled and cannot be accessed. oscillator fail bit (oscf) oscillator fail bit indicates that the oscillator has failed. the oscillator frequency is either ze ro or very far from the desired 32.768khz due to failure, pc board contamination or mechanical issues. 20h dstcr dstmofd dste d d dstmofd20 dstmofd13 dstmofd12 dstmofd11 dstmofd10 1 to 12 00h 21h dstdwfd d dstdwfde dstwkfd12 dstwkfd11 dstwkfd10 dstdwfd12 dstdwfd11 dstdwfd10 0 to 6 00h 22h dstdtfd d d dstdtfd21 dstdtfd20 dstdtfd13 dstdtfd12 dstdtfd11 dstdtfd10 1 to 31 00h 23h dsthrfd d d dsthrfd21 dsthrfd20 dsthrfd13 dsthrfd12 dsthrfd11 dsthrfd10 0 to 23 00h 24h dstmorv d d d dstmorv20 dstmorv13 dstmor12v dstmorv11 dstmorv10 01 to 12 00h 25h dstdwrv d dstdwrve dstwkrv12 dstwkrv11 dstwkrv10 dstdwrv12 dstdwrv11 dstdwrv10 0 to 6 00h 26h dstdtrv d d dstdtrv21 dstdtrv20 dstdtrv13 dstdtrv12 dstdtrv11 dstdtrv10 01 to 31 00h 27h dsthrrv d d dsthrrv21 dsthrrv20 dsthrrv13 dsthrrv12 dsthrrv11 dsthrrv10 0 to 23 00h 28h temp tk0l tk07 tk06 tk05 tk04 tk03 tk02 tk01 tk00 00 to ff 00h 29h tk0m 0 0 0 0 0 0 tk09 tk08 00 to 03 00h 2ah nppm nppml nppm7 nppm6 nppm5 nppm4 nppm3 nppm2 nppm1 nppm0 00 to ff 00h 2bh nppmh 0 0 0 0 0 nppm10 nppm9 nppm8 00 to 07 00h 2ch xt0 xt0 d d d xt4 xt3 xt2 xt1 xt0 00 to ff xxh 2dh alphah alphah d alp_h6 alp_h5 alp_h4 alp_h3 alp_h2 alp_h1 alp_h0 00 to 7f xxh 2eh gpm gpm1 gpm17 gpm16 gpm15 gpm14 gpm13 gpm12 gpm11 gpm10 00 to ff 00h 2fh gpm2 gpm27 gpm26 gpm25 gpm24 gpm23 gpm22 gpm21 gpm20 00 to ff 00h table 1. register memory map (yellow shad ing indicates read-only bits) (continued) addr. section reg name bit range default 76543210 table 2. status register (sr) addr 7 6 5 4 3 2 1 0 07h busy oscf dstdj alm lvdd lbat85 lbat75 rtcf
ISL12022M 15 fn6668.9 june 20, 2012 daylight saving time change bit (dstadj) dstadj is the daylight saving time adjusted bit. it indicates the daylight saving time forward ad justment has happened. if a dst forward event happens, dstadj will be set to ?1?. the dstadj bit will stay high when a dstfd event happens, and will be reset to ?0? when the dst reverse event happens. it is read-only and cannot be written. setting time during a dst forward period will not set this bit to ?1?. the dste bit must be enabled when the rtc time is more than one hour before the dst forward or dst reverse event time setting, or the dst event correction will not happen. dstadj is reset to ?0? upon power-up. it will reset to ?0? when the dste bit in register 15h is set to ?0? (dst disabled ), but no time adjustment will happen. alarm bit (alm) this bit announces if the alarm matches the real time clock. if there is a match, the respective bit is set to ?1?. this bit can be manually reset to ?0? by the user or automatically reset by enabling the auto-reset bit (see arst bit). a write to this bit in the sr can only set it to ?0?, not ?1?. an alarm bit that is set by an alarm occurring during an sr read operation will remain set after the read operation is complete. low v dd indicator bit (lvdd) this bit indicates when v dd has dropped below the pre-selected trip level (brownout mode). the trip po ints for the brownout levels are selected by three bits: v dd trip2, v dd trip1 and v dd trip0 in pwr_ v dd registers. the lvdd detection is only enabled in v dd mode and the detection happens in real time. the lvdd bit is set whenever the v dd has dropped below the pre-selected trip level, and self clears whenever the v dd is above the pre-selected trip level. low battery indicator 85% bit (lbat85) in normal mode (v dd ), this bit indicates when the battery level has dropped below the pre-selected trip levels. the trip points are selected by three bits: vb85tp2 , vb85tp1 and vb85tp0 in the pwr_vbat registers. the lbat85 detection happens automatically once every minute when seconds register reaches 59. the detection can also be manually triggered by setting the tse bit in beta register to ?1?. the lbat85 bit is set when the v bat has dropped below the pre-selected trip level, and will self clear when the v bat is above the pre-selected trip level at the next detection cycle either by manual or automatic trigger. in battery mode (v bat ), this bit indicates the device has entered into battery mode by polling once every 10 minutes. the lbat85 detection happens automatically once when the minute register reaches x9h or x0h minutes. example - when the lbat85 is set to ?1? in battery mode: the minute the register changes to 19h when the device is in battery mode, the lbat85 is set to ?1? the next time the device switches back to normal mode. example - when the lbat85 remains at ?0? in battery mode: if the device enters into battery mode after the minute register reaches 20h and switches back to normal mode before the minute register reaches 29h, then the lbat85 bit will remain at ?0? the next time the device switches back to normal mode. low battery indicator 75% bit (lbat75) in normal mode (v dd ), this bit indicates when the battery level has dropped below the pre-selected trip levels. the trip points are selected by three bits: vb75tp2, vb75tp1 and vb75tp0 in the pwr_vbat registers. the lbat75 detection happens automatically once every minute when seconds register reaches 59. the detection can also be manually triggered by setting the tse bit in beta register to ?1?. the lbat75 bit is set when the v bat has dropped below the pre-selected trip level, and will self clear when the v bat is above the pre-selected trip level at the next detection cycle either by manual or automatic trigger. in battery mode (v bat ), this bit indicates the device has entered into battery mode by polling once every 10 minutes. the lbat85 detection happens automatically once when the minute register reaches x9h or x0h minutes. example - when the lbat75 is set to ?1? in battery mode: the minute register changes to 30h when the device is in battery mode, the lbat75 is set to ?1? th e next time the device switches back to normal mode. example - when the lbat75 remains at ?0? in battery mode: if the device enters into battery mode after the minute register reaches 49h and switches back to normal mode before minute register reaches 50h, then the lbat75 bit will remain at ?0? the next time the device switches back to normal mode. real time clock fail bit (rtcf) this bit is set to a ?1? after a total power failure. this is a read only bit that is set by hardware (ISL12022M internally) when the device powers up after having lost all power (defined as v dd = 0v and v bat = 0v). the bit is set regardless of whether v dd or v bat is applied first. the loss of only one of the supplies does not set the rtcf bit to ?1?. the first valid write to the rtc section after a complete power failure resets the rtcf bit to ?0? (writing one byte is sufficient). interrupt control register (int) automatic reset bit (arst) this bit enables/disables the au tomatic reset of the alm, lvdd, lbat85, and lbat75 status bits only. when arst bit is set to ?1?, these status bits are reset to ?0? after a valid read of the respective status register (with a valid stop condition). when the arst is cleared to ?0?, the user must manually reset the alm, lvdd, lbat85, and lbat75 bits. write rtc enable bit (wrtc) the wrtc bit enables or disables write capability into the rtc timing registers. the factory defa ult setting of this bit is ?0?. upon initialization or power-up, the wrtc must be set to ?1? to enable the rtc. upon the completion of a valid write (stop), the rtc starts counting. the rtc intern al 1hz signal is synchronized to the stop condition during a valid write cycle. table 3. interrupt control register (int) addr 7 6 5 4 3 2 1 0 08h arst wrtc im fobatb fo3 fo2 fo1 fo0
ISL12022M 16 fn6668.9 june 20, 2012 interrupt/alarm mode bit (im) this bit enables/disables the interrupt mode of the alarm function. when the im bit is set to ?1?, the alarm will operate in the interrupt mode, where an active low pulse width of 250ms will appear at the irq /f out pin when the rtc is triggered by the alarm, as defined by the alarm registers (0ch to 11h). when the im bit is cleared to ?0?, the alar m will operate in standard mode, where the irq /f out pin will be set low until the alm status bit is cleared to ?0?. frequency output and interrupt bit (fobatb) this bit enables/disables the irq /f out pin during battery backup mode (i.e., v bat power source active). when the fobatb is set to ?1?, the irq /f out pin is disabled during battery backup mode. this means that both the frequency output and alarm output functions are disabled. when the fobatb is cleared to ?0?, the irq /f out pin is enabled during battery backup mode. note that the open drain irq /f out pin will need a pull-up to the battery voltage to operate in battery backup mode. frequency out control bits (fo <3:0>) these bits enable/disable the frequency output function and select the output frequency at the irq /f out pin. see table 5 for frequency selection. default for the ISL12022M is fo<3:0> = 1h, or 32.768khz output (f out is on ). when the frequency mode is enabled, it will override the alarm mode at the irq /f out pin. power supply control register (pwr_vdd) clear time stamp bit (clrts) this bit clears time stamp v dd to battery (tsv2b) and time stamp battery to v dd registers (tsb2v). the default setting is 0 (clrts = 0) and the enabled setting is 1 (clrts = 1). v dd brownout trip voltage bits (v dd trip<2:0>) these bits set the trip level for the v dd alarm, indicating that v dd has dropped below a preset level. in this event, the lvdd bit in the status register is set to ?1?. see table 6. battery voltage trip voltage register (pwr_vbat) this register controls the trip points for the two v bat alarms, with levels set to approximately 85% and 75% of the nominal battery level. reseal bit (resealb) this is the reseal bit for actively disconnecting the v bat pin from the internal circuitry. setting this bit allows the device to disconnect the battery and eliminate standby current drain while the device is unused. once v dd is powered up, this bit is reset and the v bat pin is then connected to the internal circuitry. the application for this bit involves placing the chip on a board with a battery and testing the board. on ce the board is tested and ready to ship, it is desirable to disconnect the battery to keep it fresh until the board or unit is placed into final use. setting resealb = ?1? initiates the battery disconnect, and after v dd power is cycled down and up again, the reseal bit is cleared to ?0?. battery level monitor trip bits (vb85tp <2:0>) three bits select the firs t alarm (85% of nominal v bat ) level for the battery voltage monitor. there are total of 7 levels that could be selected for the first alarm. any of the of levels could be selected as the first alarm with no reference as to nominal battery voltage level. see table 8. table 4. im bit interrupt/alarm frequency 0 single time event set by alarm 1 repetitive/recurring time event set by alarm table 5. frequency selection of irq /f out pin frequency, f out units fo3 fo2 fo1 fo0 0 hz 0 000 32768 hz 0 001 4096 hz 0 0 1 0 1024 hz 0 011 64 hz 0 100 32 hz 0 101 16 hz 0 110 8 hz 0 111 4 hz 1 000 2 hz 1 001 1 hz 1 010 1/2 hz 1 011 1/4 hz 1 100 1/8 hz 1 101 1/16 hz 1 110 1/32 hz 1 1 1 1 addr 7 6 5 4 3 2 1 0 09h clrts 0 0 0 0 v dd trip2 v dd trip1 v dd trip0 table 6. v dd trip levels v dd trip2 v dd trip1 v dd trip0 trip voltage (v) 0002.295 0012.550 0102.805 0113.060 1004.250 1014.675 table 7. addr76543210 0ah d resealb vb85tp2 vb85tp1 vb85tp0 vb75tp2 vb75tp1 vb75tp0
ISL12022M 17 fn6668.9 june 20, 2012 battery level monitor trip bits (vb75tp <2:0>) three bits select the second alarm (75% of nominal v bat ) level for the battery voltage monitor. there are total of 7 levels that could be selected for the second alarm. any of the of levels could be selected as the second alarm with no reference as to nominal battery voltage level. see table 9. initial at and dt setting register (itro) these bits are used to trim the initial error (at room temperature) of the crystal. both digital trimming (dt) and analog trimming (at) methods are available. the digital trimming uses clock pulse skipping and insertion for frequency adjustment. analog trimming uses load capacitance adjustment to pull the oscillator frequency. a range of +62.5ppm to -61.5ppm is possible with combined digital an d analog trimming. initial values for the itr0 register are preset internally and recalled to ram registers on power-up. these values are pre-set in device production and are read-only. they cannot be overwritten by the user. if an application requires ad justment of the iatr bits outside the preset values, the user should contact intersil . aging and initial trim digital trimming bits (idtr0<1:0>) these bits allow 30.5ppm initial trimming range for the crystal frequency. this is meant to be a coarse adjustment if the range needed is outside that of the iatr control. see table 10. the idtr0 register should only be changed while the tse (temp sense enable) bit is ?0?. the ISL12022M has a preset init ial digital trimming value corresponding to the crystal in the module. this value is recalled on initial power-up and is read-only. it cannot be overwritten by the user. aging and initial analog trimming bits (iatr0<5:0>) the initial analog trimming register allows +32ppm to -31ppm adjustment in 1ppm/bit incremen ts. this enables fine frequency adjustment for trimming initial crystal accuracy error or to correct for aging drift. the ISL12022M has a preset init ial analog trimming value corresponding to the crystal in the module. this value is recalled on initial power-up, is preset in device production and is read-only. it cannot be overwritten by the user. table 8. vb85t alarm level vb85tp2 vb85tp1 vb85tp0 battery alarm trip level (v) 000 2.125 0 0 1 2.295 0 1 0 2.550 0 1 1 2.805 1 0 0 3.060 1 0 1 4.250 1 1 0 4.675 table 9. battery level monitor trip bits (vb75tp <2:0>) vb75tp2 vb75tp1 vb75tp0 battery alarm trip level (v) 000 1.875 0 0 1 2.025 0 1 0 2.250 011 2.475 1 0 0 2.700 1 0 1 3.750 110 4.125 table 10. idtr0 trimming range idtr01 idtr00 trimming range 00default/disabled 0 1 +30.5ppm 100ppm 1 1 -30.5ppm table 11. initial at and dt setting register addr7 6543210 0bh idtr01 idtr00 iatr05 iatr04 iatr03 iatr02 iatr01 iatr00 table 12. iatro trimming range iatr05 iatr04 iatr03 iatr02 iatr01 iatr00 trimming range 000000+32 000001+31 000010+30 000011+29 000100+28 000101+27 000110+26 000111+25 001000+24 001001+23 001010+22 001011+21 001100+20 001101+19 001110+18 001111+17 010000+16 010001+15 010010+14
ISL12022M 18 fn6668.9 june 20, 2012 alpha register (alpha) the alpha variable is 8 bits and is defined as the temperature coefficient of crystal from -40c to t0, or the alpha cold (there is an alpha hot register that must be programmed as well). it is normally given in units of ppm/c 2 , with a typical value of -0.034. the ISL12022M device uses a scaled version of the absolute value of this coefficient in order to get an integer value. therefore, alpha <7:0> is defined as the (|actual alpha value| x 2048) and converted to binary. for example, a crystal with alpha of -0.034ppm/c 2 is first scaled (|2048*(-0.034)| = 70d) and then converted to a binary number of 01000110b. the practical range of actual alpha values is from -0.020 to -0.060. the ISL12022M has a preset alpha value corresponding to the crystal in the module. this value is recalled on initial power-up and is preset in device production. it is read only and cannot be overwritten by the user. beta register (beta) the beta register has special write properties. only the tse, btse and btsr bits can be writte n; the beta bits are read-only. a write to both bytes in this regi ster will only change the 3 msb?s (tse, btse, btsr), and the 5 lsb?s will remain the same as set at the factory. temperature sensor enabled bit (tse) this bit enables the temperature sensing operation, including the temperature sensor, a/d converter and fatr/fdtr register adjustment. the default mode after power-up is disabled: (tse = 0). to enable the operation, tse should be set to 1. (tse = 1). when temp sense is disabled, the initial values for iatr and idtr registers are used for frequency control. when tse is set to 1, the temperature conversion cycle begins and will end when two temperature conversions are completed. the average of the two conversions is in the temp registers. 010011+13 010100+12 010101+11 010110+10 010111 +9 011000 +8 011001 +7 011010 +6 011011 +5 011100 +4 011101 +3 011110 +2 011111 +1 100000 0 100001 -1 100010 -2 100011 -3 100100 -4 100101 -5 100110 -6 100111 -7 101000 -8 101001 -9 101010-10 101011-11 101100-12 101101-13 101110-14 101111-15 110000-16 110001-17 110010-18 110011-19 110100-20 110101-21 110110-22 110111-23 111000-24 111001-25 111010-26 table 12. iatro trimming range (continued) iatr05 iatr04 iatr03 iatr02 iatr01 iatr00 trimming range 111011-27 111100-28 111101-29 111110-30 111111-31 table 13. alpha register addr76543210 0ch d alpha6 alpha5 alpha4 alpha3 alpha2 alpha1 alpha0 table 14. addr76543210 0dh tse btse btsr beta4 beta3 beta2 beta1 beta0 table 12. iatro trimming range (continued) iatr05 iatr04 iatr03 iatr02 iatr01 iatr00 trimming range
ISL12022M 19 fn6668.9 june 20, 2012 temp sensor conversion in battery mode bit (btse) this bit enables the temperature sensing and correction in battery mode. btse = 0 (default) no conversion, temp sensing or compensation in battery mode. btse = 1 indicates temp sensing and compensation enabled in batt ery mode. the btse is disabled when the battery voltage is lower than 2.7v. no temperature compensation will take place with v bat <2.7v. frequency of temperature sensing and correction bit (btsr) this bit controls the frequency of temp sensing and correction. btsr = 0 default mode is every 10 minutes, btsr = 1 is every 1.0 minute. note that btse has to be enabled in both cases. see table 15. the temperature measurement conv ersion time is the same for battery mode as for v dd mode, approximately 22ms. the battery mode current will increase during this conversion time to typically 68a. the average increase in batt ery current is much lower than this due to the small duty cycle of the on-time versus off-time for the conversion. to figure the average increase in battery current, we take the change in current times the duty cycle. for the 1 minute temperature period, the average current is expressed in equation 1: for the 10 minute temperature period the average current is expressed in equation 2: if the application has a stable temperature environment that doesn?t change quickly, the 10 minute option will work well and the backup battery lifetime impact is minimized. if quick temperature variations are expected (multiple cycles of more than 10 within an hour), then the 1 minute option should be considered and the slightly higher battery current figured into overall battery life. gain factor of at bit (beta<4:0>) beta is specified to take care of the cm variations of the crystal. most crystals specify cm around 2.2ff. for example, if cm > 2.2ff, the actual at steps may reduce from 1ppm/step to approximately 0.80ppm/step. beta is then used to adjust for this variation and restore the step size to 1ppm/step. beta values are limited in the range from 01000 to 11111, as shown in table 16 . to use table 16, the device is tested at two at settings as follows: beta values = (at(max) - at (min))/63, where: at(max) = f out in ppm (at at = 00h) and at(min) = f out in ppm (at at = 3fh). the beta values result is indexed in the right hand column and the resulting beta factor (for the register) is in the same row in the left column. the ISL12022M has a preset beta value corresponding to the crystal in the module. this value is recalled on initial power-up and is preset in device production. it is read only and cannot be overwritten by the user. table 15. frequency of temperature sensing and correction bit btse btsr tc period in battery mode 00off 01off 1010 minutes 111 minute i bat 0.022s 60s ----------------- - = 68 a 250na = (eq. 1) i bat 0.022s 600s ----------------- - = 68 a 25na = (eq. 2) table 16. beta values beta<4:0> at step adjustment 01000 0.5000 00111 0.5625 00110 0.6250 00101 0.6875 00100 0.7500 00011 0.8125 00010 0.8750 00001 0.9375 00000 1.0000 10000 1.0625 10001 1.1250 10010 1.1875 10011 1.2500 10100 1.3125 10101 1.3750 10110 1.4375 10111 1.5000 11000 1.5625 11001 1.6250 11010 1.6875 11011 1.7500 11100 1.8125 11101 1.8750 11110 1.9375 11111 2.0000
ISL12022M 20 fn6668.9 june 20, 2012 final analog trimming register (fatr) this register shows the final setting of at after temperature correction. it is read-only; the user cannot overwrite a value to this register. this value is accessibl e as a means of monitoring the temperature compensation function. see table 17 and table 18 (for values). final digital trimming register (fdtr) this register shows the final setting of dt after temperature correction. it is read-only; the user cannot overwrite a value to this register. the value is acce ssible as a means of monitoring the temperature compensation function. the corresponding clock adjustment values are shown in table 19. the fdtr setting has both positive and negative settings to adjust for any offset in the crystal. . alarm registers (10h to 15h) the alarm register bytes are set up identical to the rtc register bytes, except that the msb of each byte functions as an enable bit (enable = ?1?). these enable bits specify which alarm registers (seconds, minutes, etc.) are used to make the comparison. note that there is no alarm byte for year. the alarm function works as a comparison between the alarm registers and the rtc registers. as the rtc advances, the alarm will be triggered once a match occurs between the alarm registers and the rtc registers. any one alarm register, multiple registers, or all registers can be enabled for a match. there are two alarm operation mo des: single event and periodic interrupt mode: ? single event mode is enabled by setting the bit 7 on any of the alarm registers (esca0... edwa0) to ?1?, the im bit to ?0?, and disabling the frequency output. this mode permits a one-time match between the alarm registers and the rtc registers. once this match occurs, the alm bit is set to ?1? and the irq /f out output will be pulled low and will remain low until the alm bit is reset. this can be done manually or by using the auto-reset feature. ? interrupt mode is enabled by setting the bit 7 on any of the alarm registers (esca0... edwa0) to ?1?, the im bit to ?1?, and disabling the frequency output. the irq /f out output will now be pulsed each time an alarm occurs. this means that once the interrupt mode alarm is set, it will continue to alarm for each occurring match of the alarm and present time. this mode is convenient for hourly or daily hardware interrupts in microcontroller applications such as security cameras or utility meter reading. to clear a single event alarm, th e alm bit in the status register must be set to ?0? with a write. note that if the arst bit is set to 1 (address 08h, bit 7), the alm bit will automatically be cleared when the status register is read. following are examples of both single event and periodic interrupt mode alarms. example 1 ? alarm set with single interrupt (im = ?0?) ? a single alarm will occur on january 1 at 11:30 a.m. ? set alarm registers as follows: after these registers are set, an alarm will be generated when the rtc advances to exactly 11:30 a.m. on january 1 (after seconds changes from 59 to 00) by setting the alm bit in the status register to ?1? and also bringing the irq /f out output low. table 17. final analog trimming register addr76543210 0eh 0 0 fatr5 fatr4 fatr3 fatr2 fatr1 fatr0 table 18. final digital trimming register addr765 4 3 2 1 0 0fh 0 0 0 fdtr4 fdtr3 fdtr2 fdtr1 fdtr0 table 19. clock adjustment values for final digital trimming register fdtr<4:0> decimal ppm adjustment 00000 0 0 00001 1 30.5 00010 2 61 00011 3 91.5 00100 4 122 00101 5 152.5 00110 6 183 00111 7 213.5 01000 8 244 01001 9 274.5 01010 10 305 10000 0 0 10001 -1 -30.5 10010 -2 -61 10011 -3 -91.5 10100 -4 -122 10101 -5 -152.5 10110 -6 -183 10111 -7 -213.5 11000 -8 -244 11001 -9 -274.5 11010 -10 -305 alarm register bit description 76543210 hex sca0 00000000 00hseconds disabled mna0 10110000 b0hminutes set to 30, enabled hra0 10010001 91hhours set to 11, enabled dta0 10000001 81hdate set to 1, enabled moa0 10000001 81hmonth set to 1, enabled dwa0 00000000 00hday of week disabled
ISL12022M 21 fn6668.9 june 20, 2012 example 2 ? pulsed interrupt once per minute (im = ?1?) ? interrupts at one minute interval s when the seconds register is at 30 seconds. ? set alarm registers as follows: once the registers are set, the following waveform will be seen at irq /f out : note that the status register al m bit will be set each time the alarm is triggered, but does not need to be read or cleared. time stamp v dd to battery registers (tsv2b) the tsv2b register bytes are identical to the rtc register bytes, except they do not extend beyo nd the month. the time stamp captures the first v dd to battery voltage tran sition time, and will not update upon subsequent events until cleared (only the first event is captured before clearing). set clrts = 1 to clear this register (add 09h, pwr_v dd register). note that the time stamp registers are cleared to all ?0?, including the month and day, which is different from the rtc and alarm registers (those registers default to 01h). this is the indicator that no time stamping has occurred since the last clear or initial power-up. once a time stamp occurs, there will be a non- zero time stamp. time stamp battery to v dd registers (tsb2v) the time stamp battery to v dd register bytes are identical to the rtc register bytes, except they do not extend beyond month. the time stamp captures the last transition of v bat to v dd (only the last event of a series of power-up/power-down events is retained). set clrts = 1 to clear this register (add 09h, pwr_v dd register). dst control registers (dstcr) 8 bytes of control registers have been assigned for the daylight savings time (dst) functions. ds t beginning (set forward) time is controlled by the registers dstmofd, dstdwfd, dstdtfd, and dsthrfd. dst ending time (set backward or reverse) is controlled by dstmorv, dstdwrv, dstdtrv and dsthrrv. tables 20 and 21 describe the structure and functions of the dstcr. dst forward registers (20h to 23h) dst forward is controlled by the following dst registers: dst enable dste is the dst enabling bit located in bit 7 of register 20h (dstmofdxx). set dste = 1 will enable the dste function. upon powering up for the first time (i ncluding battery), the dste bit defaults to ?0?. when dste is set to ?1? the rtc time must be at least one hour before the sche duled dst time change for the correction to take place. when dste is set to ?0?, the dstadj bit in the status register automatically resets to ?0?. dst month forward dstmofd sets the month that dst starts. the format is the same as for the rtc register month, from 1 to 12. the default value for the dst begin month is 00h. dst day/week forward dstdwfd contains both the day of the week and the week of the month data for dst forward contro l. dst can be controlled either by actual date or by setting both the week of the month and the day of the week. dstdwfde sets the priority of the day/week over the date. for dstdwfde = 1, day/week is the priority. you must have the correct day of week entered in the rtc registers for the day/week correction to work properly. ? bits 0, 1, 2 contain the day of the week information which sets the day of the week that dst starts. note that day of the week counts from 0 to 6, like the rtc registers. the default for the dst forward day of the week is 00h (normally sunday). ? bits 3, 4, 5 contain the week of the month information that sets the week that dst starts. the rang e is from 1 to 5, and week 7 is used to indicate the last w eek of the month. the default for the dst forward week of the month is 00h. dst date forward dstdtfd controls which date dst begins. the format for the date is the same as for the rtc register, from 1 to 31. the default value for dst forward date is 00h . dstdtfd is only effective if dstdwfde = 0. dst hour forward dsthrfd controls the hour that dst begins. the rtc hour and dsthrfd registers have the same formats except there is no military bit for dst hour. the user sets the dst hour with the same format as used for the rtc hour (am/pm or mil) but without the mil bit, and the dst will still advance as if the mil bit were there. the default value for dst hour forward is 00h. alarm register bit description 76543210 hex sca0 10110000 b0hseconds set to 30, enabled mna0 00000000 00hminutes disabled hra0 00000000 00hhours disabled dta0 00000000 00hdate disabled moa0 00000000 00hmonth disabled dwa0 00000000 00hday of week disabled 60s rtc and alarm registers are both ?30s? figure 16. irq /f out waveform
ISL12022M 22 fn6668.9 june 20, 2012 dst reverse registers (24h to 27h) dst end (reverse) is controlled by the following dst registers: dst month reverse dstmorv sets the month that dst ends. the format is the same as for the rtc register month, from 1 to 12. the default value for the dst end month is october (10h). dst day/week reverse dstdwrv contains both the day of the week and the week of the month data for dst reverse control. dst can be controlled either by actual date or by setting both the week of the month and the day of the week. dstdwrve sets the priority of the day/week over the date. for dstdwrve = 1, day/week is the priority. you must have the correct day of week entered in the rtc registers for the day/week correction to work properly. ? bits 0,1,2 contain the day of the week information which sets the day of the week that dst ends. note that day of the week counts from 0 to 6, like the rtc registers. the default for the dst reverse day of the week is 00h (normally sunday). ? bits 3, 4, 5 contain the week of the month information that sets the week that dst ends. the range is from 1 to 5, and week 7 is used to indicate the last week of the month. the default for the dst reverse week of the month is 00h. dst date reverse dstdtrv controls which date dst ends. the format for the date is the same as for the rtc register, from 1 to 31. the default value for dst date reverse is 00h. the dstdtrv is only effective if the dwrve = 0. dst hour reverse dsthrrv controls the hour that dst ends. the rtc hour and dsthrfd registers have the same formats except there is no military bit for dst hour. the user sets the dst hour with the same format as used for the rtc hour (am/pm or mil) but without the mil bit, and the dst will still advance as if the mil bit were there. the default value for dst hour reverse is 00h. temp registers (temp) the temperature sensor produces an analog voltage output which is input to an a/d converter and produces a 10-bit temperature value in degrees kelvin. tk07:00 are the lsbs of the code, and tk09:08 are the msbs of the code. the temperature result is actually the average of two successive temperature measurements to produce greater resolution for the temperature control. the output code can be converted to c by first converting from binary to decimal, dividing by 2, and then subtracting 273d. the practical range for the temp sensor register output is from 446d to 726d, or -50c to +90c. th e temperature compensation function is only guaranteed over -40c to +85c. the tse bit must be set to ?1? to enable temperature sensing. nppm registers (nppm) the nppm value is exactly 2x the net correction, in ppm, required to bring the oscillator to 0ppm error. the value is the combination of oscillator initial correction (ippm) and crystal temperature dependent correction (cppm). ippm is used to compensate the oscillator offset at room temperature and is controlled by th e itr0 and beta registers. this value is normally set during room temperature testing. the cppm compensates the oscillator frequency fluctuation over- temperature. it is determined by the temperature (t), crystal curvature parameter (alpha), and crystal turnover temperature (xt0). t is the result of the te mp sensor/adc conversion, whose decimal result is 2x the actual temperature in kelvin. alpha is from either the alpha (cold) or alphah (hot) register depending on t, and xt0 is from the xt0 register. table 20. dst forward registers addressfunction76543210 20h month forward dste 0 0 mofd20 mofd13 mofd12 mofd11 mofd10 21h day forward 0 dwfde wkfd12 wkfd11 wkfd10 dwfd12 dwfd11 dwfd10 22h date forward 0 0 dtfd21 dtfd20 dtfd13 dtfd12 dtfd11 dtfd10 23h hour forward 0 0 hrfd21 hrfd20 hrfd13 hrfd12 hrfd11 hrfd10 table 21. dst reverse registers addressname 76543210 24h month reverse 0 0 0 morv20morv13morv12morv11morv10 25h day reverse 0 dwrve wkrv12 wkrv11 wkrv10 dwrv12 dwrv11 dwrv10 26h date reverse 0 0 dtrv21 dtrv20 dtrv13 dtrv12 dtrv11 dtrv10 27h hour reverse 0 0 hrrv21 hrrv20 hrrv13 hrrv12 hrrv11 hrrv10 table 22. temp76543210 tk0l tk07 tk06 tk05 tk04 tk03 tk02 tk01 tk00 tk0m000000tk09tk08 temperature in c [(tk <9:0>)/2] - 273 = (eq. 3)
ISL12022M 23 fn6668.9 june 20, 2012 nppm is governed by equations 4 and 5: where t is the reading of the adc, resu lt is 2 x temperature in degrees kelvin. or note that nppm can also be pr edicted from the fatr and fdtr register by the relationship (all values in decimal): nppm = 2*(beta*fatr - (fdtr-16) xt0 registers (xt0) turnover temperature (xt<3:0>) the apex of the alpha curve occurs at a point called the turnover temperature, or xt0. crystals normally have a turnover temperature between +20c and +30c, with most occurring near +25c. the ISL12022M has a preset turnover temperature corresponding to the crystal in the module. this value is recalled on initial power-up and is preset in device production. it is read only and cannot be overwritten by the user. table 24 shows the values available, with a range from +17.5c to +32.5c in +0.5c increments. the default value is 00000b or +25c. alpha hot register (alphah) the alpha hot variable is 7 bits and is defined as the temperature coefficient of crystal from the xt 0 value to +85c (both alpha hot and alpha cold must be programmed to provide full temperature compensation). it is norma lly given in units of ppm/c 2 , with a typical value of -0.034. like the alpha cold version, a scaled version of the absolute value of this coefficient is used in order to get an integer value. therefore, alp_h <7:0> is defined as the (|actual alpha hot value| x 2048) and converted to binary. for example, a crystal with alpha hot of -0.034ppm/c 2 is first scaled (|2048*(-0.034)| = 70d) and then converted to a binary number of 01000110b. the practical range of actual alph ah values is from -0.020 to -0.060. the ISL12022M has a preset alphah value corresponding to the crystal in the module. this value is recalled on initial power-up and is preset in device producti on. it is read only and cannot be overwritten by the user. table 23. turnover temperature addr76543210 2ch 0 0 0 xt4xt3xt2xt1xt0 table 24. xt0 values xt<4:0> turnover temperature 01111 32.5 01110 32.0 01101 31.5 01100 31 01011 30.5 01010 30 01001 29.5 01000 29.0 00111 28.5 00110 28.0 00101 27.5 00100 27.0 00011 26.5 nppm ippm alpha t t0 ? () ? 2 4096 --------------------------------------------------- - + = (eq. 4) nppm ippm cppm + = nppm ippm itro,beta () alpha t-t0 () 2 + = alpha 2048 ? = t2298 ? () xt0 + = (eq. 5) t 596 xt0 + = 00010 26.0 00001 25.5 00000 25.0 10000 25.0 10001 24.5 10010 24.0 10011 23.5 10100 23.0 10101 22.5 10110 22.0 10111 21.5 11000 21.0 11001 20.5 11010 20.0 11011 19.5 11100 19.0 11101 18.5 11110 18.0 11111 17.5 table 25. alphah register addr76543210 2dh d alp_h6 alp_h5 alp_h4 alp_h3 alp_h2 alp_h1 alp_h0 table 24. xt0 values (continued) xt<4:0> turnover temperature
ISL12022M 24 fn6668.9 june 20, 2012 user registers (accessed by using slave address 1010111x) addresses [00h to 7fh] these registers are 128 bytes of battery-backed user sram. the separate i 2 c slave address must be used to read and write to these registers. i 2 c serial interface the ISL12022M supports a bi-direc tional bus oriented protocol. the protocol defines any device that sends data onto the bus as a transmitter and the receiving devi ce as the receiver. the device controlling the transfer is th e master and the device being controlled is the slave. the master always initiates data transfers and provides the clock for both transmit and receive operations. therefore, the ISL12022M operates as a slave device in all applications. all communication over the i 2 c interface is conducted by sending the msb of each byte of data first. protocol conventions data states on the sda line can change only during scl low periods. sda state changes duri ng scl high are reserved for indicating start and stop conditions (see figure 17). on power- up of the ISL12022M, the sda pin is in the input mode. all i 2 c interface operations must begin with a start condition, which is a high to low transition of sda while scl is high. the ISL12022M continuously monitors the sda and scl lines for the start condition and does not respond to any command until this condition is met (see figure 17). a start condition is ignored during the power-up sequence. all i 2 c interface operations must be terminated by a stop condition, which is a low to high transition of sda while scl is high (see figure 17). a stop condition at the end of a read operation or at the end of a write operation to memory only places the device in its standby mode. figure 17. valid data change s, start and stop conditions figure 18. acknowledge response from receiver figure 19. byte write sequence (slave address for csr shown) sda scl start data data stop stable change data stable sda output from transmitter sda output from receiver 8 1 9 start ack scl from master high impedance high impedance s t a r t s t o p identification byte data byte a c k signals from the master signals from the ISL12022M a c k 10 0 11 a c k write signal at sda 0000 111 address byte
ISL12022M 25 fn6668.9 june 20, 2012 an acknowledge (ack) is a software convention used to indicate a successful data transfer. the tr ansmitting device, either master or slave, releases the sda bus after transmitting eight bits. during the ninth clock cycle, the receiver pulls the sda line low to acknowledge the reception of the eight bits of data (see figure 18). the ISL12022M responds with an ack after recognition of a start condition followed by a valid identification byte, and once again, after successful rece ipt of an address byte. the ISL12022M also responds with an ack after receiving a data byte of a write operation. the master must respond with an ack after receiving a data by te of a read operation. device addressing following a start condition, the master must output a slave address byte. the 7 msbs are the device identifiers. these bits are ?1101111? for the rtc registers and ?1010111? for the user sram. the last bit of the slave address byte defines a read or write operation to be performed. when this r/w bit is a ?1?, a read operation is selected. a ?0? sele cts a write operation (refer to figure 20). after loading the entire slave address byte from the sda bus, the ISL12022M compares the device iden tifier and device select bits with ?1101111? or ?1010111?. upon a correct compare, the device outputs an acknowledge on the sda line. following the slave byte is a one byte word address. the word address is either supplied by the master device or obtained from an internal counter. on power-up, the internal address counter is set to address 00h, so a current address read starts at address 00h. when required, as part of a random read, the master must supply the 1 word address bytes, as shown in figure 21. in a random read operation, the slave byte in the ?dummy write? portion must match the slave byte in the ?read? section. for a random read of the control/status registers, the slave byte must be ?1101111x? in both places. write operation a write operation requires a start condition, followed by a valid identification byte, a valid address byte, a data byte, and a stop condition. after each of the three bytes, the ISL12022M responds with an ack. at this time, the i 2 c interface enters a standby state. read operation a read operation consists of a thr ee byte instruction, followed by one or more data bytes (see figure 21). the master initiates the operation issuing the following sequence: a start, the identification byte with the r/w bit set to ?0?, an address byte, a second start, and a second identification byte with the r/w bit set to ?1?. after each of the three bytes, the ISL12022M responds with an ack. then the ISL12022M transmits data bytes as long as the master responds with an ac k during the scl cycle following the eighth bit of each byte. th e master terminates the read operation (issuing a stop condition) following the last bit of the last data byte (see figure 21). the data bytes are from the memory location indicated by an internal pointer. this pointer?s in itial value is determined by the address byte in the read operat ion instruction, and increments by one during transmission of ea ch data byte. after reaching the memory location 2fh, the pointer ?rolls over? to 00h, and the device continues to output data for each ack received. figure 20. slave address, word address, and data bytes slave address byte d7 d6 d5 d2 d4 d3 d1 d0 a0 a7 a2 a4 a3 a1 data byte a6 a5 1 10 1 1 1 r/w 1 word address figure 21. read sequence (csr slave address shown) signals from the master signals from the slave signal at sda s t a r t identification byte with r/w = 0 address byte a c k a c k 0 s t o p a c k 1 identification byte with r/w = 1 a c k s t a r t last read data byte first read data byte a c k 10 1 1111 10 1 11 11
ISL12022M 26 fn6668.9 june 20, 2012 application section power supply considerations the ISL12022M contains programmed eeprom registers which are recalled to volatile ram registers during initial power-up. these registers contain dc voltage, frequency and temperature calibration settings. initial power-up can be either application of v bat or v dd power, whichever is first. it is important that the initial power-up meet the power supply slew rate specification to avoid faulty eeprom power-up recall. also, any glitches or low voltage dc pauses should be avoided, as these may activate recall at a low voltage and load erroneous data into the calibration registers. note that a very slow v dd ramp rate (outside data sheet limits) will almost always trigger erroneous recall and should be avoided entirely. battery backup details the ISL12022M has automatic switchover to battery backup when the v dd drops below the v bat mode threshold. a wide variety of backup sources can be used, including standard and rechargeable lithium, supercapac itors, or regulated secondary sources. the serial interface is disabled in battery backup, while the oscillator and rtc registers are operational. the sram register contents are powered to preserve their contents as well. the input voltage range for v bat is 1.8v to 5.5v, but keep in mind the temperature compensation only operates for v bat >2.7v. note that the device is not guaranteed to operate with a v bat < 1.8v, so the battery should be changed before discharging to that level. it is strongly advised to monitor the low battery indicators in the status registers and take action to replace discharged batteries. if a supercapacitor is used, it is possible that it may discharge to below 1.8v during prolonged po wer-down. once powered up, the device may lose serial bus communications until both v dd and v bat are powered down together. to avoid that situation, including situations where a battery may di scharge deeply, the circuit in figure 22 can be used. the diode, d bat will add a small drop to the battery voltage but will protect the circuit should battery voltage drop below 1.8v. the jumper is added as a safeguard should the battery ever need to be disconnected from the circuit. the v dd negative slew rate should be limited to below the data sheet spec (10v/ms) otherwise battery switchover can be delayed, resulting in sram cont ents corruption and oscillator operation interruption. some applications will require separate supplies for the rtc v dd and the i 2 c pull-ups. this is not advised, as it may compromise the operation of the i 2 c bus. for applications th at do require serial bus communication with the rtc v dd powered down, the sda pin must be pulled low during the time the rtc v dd ramps down to 0v. otherwise, the device may lose serial bus communications once v dd is powered up, and will return to normal operation only once v dd and v bat are both powered down together. layout considerations the ISL12022M contains a quartz crystal and requires special handling during pc board assembly. excessive shock and vibrations should be avoided, especially with automated handling equipment. ultrasound cleaning is not advisabl e as it subjects the crystal to resonance and possible failure. se e also note 6 on page 5 in the specifications tables, which pertains to solder reflow effects on oscillator accuracy. the part of the package from pin 1 to 5 and from pin 16 to 20 contains the crystal. low frequency rtc crystals are known to pick up noise very easily if layout precautions are not followed, even embedded within a plastic package. most instances of erratic clocking or large accuracy errors can be traced to the susceptibility of the oscillator circuit to interference from adjacent high speed clock or data lines. careful layout of the rtc circuit will avoid noise pickup and insure accurate clocking. figure 23 shows a suggested layout for the ISL12022M device. the following main precautions should be followed: ? do not run the serial bus lines or any high speed logic lines in the vicinity of pins 1 and 20, or under the package. these logic level lines can induce noise in the oscillator circuit, causing misclocking. ? add a ground trace around the de vice with one end terminated at the chip ground. this guard ring will provide termination for emitted noise in the vicinity of the rtc device ? be sure to ground pins 6 and 15 as well as pin 8 as these all insure the integrity of the device ground ? add a 0.1f decoupling capacitor at the device v dd pin, especially when using the 32.768khz f out function. the best way to run clock lines around the rtc is to stay outside of the ground ring by at least a few millimeters. also, use the v bat and v dd as guard ring lines as well, they can isolate clock lines from the oscillator section. in addition, if the irq /f out pin is used as a clock, it should be routed away from the rtc device as well. figure 22. suggested battery backup circuit d bat c bat c in bat43w 0.1f 0.1f v dd = 2.7v v bat = 1.8v j bat ISL12022M v dd gnd v bat to 3.2v to 5.5v + figure 23. suggested la yout for the ISL12022M f out scl sda ground ring
ISL12022M 27 fn6668.9 june 20, 2012 measuring oscillator accuracy the best way to analyze the ISL12022M frequency accuracy is to set the irq /f out pin for a specific frequency, and look at the output of that pin on a high accuracy frequency counter (at least 7 digits accuracy). note that the irq /f out is an drain output and will require a pull-up resistor. using the 1.0hz output frequency is the most convenient as the ppm error is expressed in equation 6: other frequencies may be used for measurement but the error calculation becomes more complex. use the f out output and a frequency counter for the most accurate results. also, when the proper layout guidelines above are observed, the oscillator should start-up in most circuits in less than one second. temperature compensation operation the ISL12022M temperature compensation feature needs to be enabled by the user. this must be done in a specific order as follows. 1. read register 0dh, the beta re gister. this register contains the 5-bit beta trimmed value, which is automatically loaded on initial power-up. mask off the 5 lsb?s of the value just read. 2. bit 7 of the beta register is the master enable control for temperature sense operation. set this to ?1? to allow continuous temperature freq uency correction. frequency correction will then happen every 60 seconds with v dd applied. 3. bits 5 and 6 of the beta register control temperature compensation in battery backup mode (see table 15). set the values for the operation desired. 4. write back to register 0dh making sure not to change the 5 lsb values, and include the desired compensation control bits. note that every time the beta register is written with the tse bit = 1, a temperature compensati on cycle is instigated and a new correction value will be loaded into the fatr/fdtr registers (if the temperature changed since the last conversion). also note that registers 0bh and 0ch, the itr0 and alpha registers, are read-only, and cannot be written to. also the value for beta is locked and cannot be changed with a write. however, it is still a good idea to do the bit masking when doing tse bit changes. daylight savings time (dst) example dst involves setting the forward and back times and allowing the rtc device to automatically adva nce the time or set the time back. this can be done for current year, and future years. many regions have dst rules that us e standard months, weeks and time of the day, which permit a pre-programmed, permanent setting. table 26 shows an example setup for the ISL12022M. the enable bit (dste) is in the month forward register, so the bcd value for that register is altered with the additional bit. the week and day values along with week/day vs date select bit is in the week/day register, so that value is also not straight bcd. hour and month are normal bcd, but the ho ur doesn?t use the mil bit since military time pm values are already discretely different from am/pm time pm values. the dst reverse setting utilizes the option to select the last week of the mo nth for october, which could have 4 or 5 weeks but needs to have the time change on the last sunday. note that the dstadj bit in the status register monitors whether the dst forward adjustment has happened. when it is ?1?, dst forward has taken place. when it is ?0?, then either dst reverse has happened, or it has been reset either by initial power-up or if the dste bit has been set to ?0?. ppm error f out 11e6 ? ? = (eq. 6) table 26. dst example variable value register value month forward and dst enable april 15h 84h week and day forward and select day/week, not date 1st week and sunday 16h 48h date forward not used 17h 00h hour forward 2am 18h 02h month reverse october 19h 10h week and day reverse and select day/week, not date last week and sunday 1ah 78h date reverse not used 1bh 00h hour reverse 2am 1ch 02h
ISL12022M 28 fn6668.9 june 20, 2012 revision history the revision history provided is for informational purposes only and is believed to be accurate, but not warranted. please go t o web to make sure you have the latest rev. date revision change may 15, 2012 fn6668.9 ?absolute maximum rating s? on page 5, latch-up. changed from: latch-up. . . . . . . . . . . . . .class ii level a , passed at +85c ambient with the level a latch-up criteria of 100ma or 1.5*vmax input to latch-up (tested per jesd-78b, class 2, level a. . . . . . 100ma added new section header ?oscillator accuracy? on page 6 removed min/max of -5/5ppm for ?oscillator stability vs temperature? on page 6. added typ of 2ppm changed min/max for ?oscillator initial accuracy? on page 6 from -3/+3 ppm to -2/+8ppm added ?oscillator accuracy after reflow cycle? on page 6. added notes 17, 18 cross references where required to above specs. added note 19 to ?oscillator stability vs voltage? on page 6. added notes 17, 18 and 19 to end of spec table on page 7. ?layout considerations? on page 26. changed 1st sentence of 2nd paragraph from: "the part of the package that has nc pins from pin 1 to 5 an d from pin 16 to 20 contains the crystal." to "the part of the package from pin 1 to 5 and from pin 16 to 20 contains the crystal." october 31, 2011 fn6668.8 converted to newest datasheet template. description, 1st paragraph, added ?backup battery current draw is less than 1.6a over the temperature range.? features: added bullet ?1.6a max battery current? ?pin descriptions? on page 2; added ground pin row and separated vdd pin. ordering information table - updated tape & reel note in ordering information to new standard "add "-t*" suffix for tape and reel." the "*" covers all possible tape and reel options. added shock, vibration in ?absolute maximum ratings? on page 5 idd1 at 5v/3v limits changed from: 7/6a to: 15/14a power-down timing, added vddsr+ as typical, with note 16. added note 16 for vddsr+: "to avoid eeprom recall issues, it is advised to use this minimum power up slew rate. not tested, shown as typical only." ?oscillator compensation? on page 12, text deleted: "these va lues can be overwritten by the user although this is not suggested as the resulting temperature comp ensation performance will be compromised." ?oscillator fail bit (oscf)? on page 14: changed text from : "oscillator fail bit indicates that the oscillator has stopped." to: "oscillator fail bit indicates that the oscillator has failed. the oscillator frequency is either zero or very far from the desired 32.768khz due to failure, pc board contamination or mechanical issues." dstadj bit, removed: "dstadj can be set to "1" for inst ances where the rtc device is initialized during the dst forward period." added: "it is read-only and cannot be writ ten. setting time during a ds t forward period will not set this bit to "1"." table 19 on page 20, fdtr changed from <2:0> to <4:0> added ?power supply considerations? on page 26 updated ?package outline drawing? on page 31 from rev 2 to rev 3, due to the following changes: top view: corrected "7.50 bsc" to "7.60/7.40" (no change from rev 2; error was introduced in conversion) changed "10.30 bsc" to "10.65/10.00" (no change from rev 2; error was introduced in conversion) side view: changed "12.80 bsc" to "13.00/12.60" (no chan ge from rev 2; error was introduced in conversion) changed "2.65 max" to "2.65/2.35" (no change fr om rev 2; error was introduced in conversion) changed note 1 from "ansi y14.5m-1982." to "asme y14.5m-1994" updated to new pod format by moving dimensions from table onto drawing and adding land pattern may 27, 2010 fn6668.7 added cdm to ?esd rating? on page 5 added ?related literature? on page 1 january 20, 2010 fn6668.6 updated note 2 in ordering information table from ?these intersil pb-free plastic packaged products emp loy special pb- free material sets, molding compounds/die attach materials, and 100% matte tin plate plus anneal (e3 termination finish, which is rohs compliant and compatible with both snpb and pb-fre e soldering operations). intersil pb-free products are msl classified at pb-free peak reflow temperatures that m eet or exceed the pb-free requirements of ipc/jedec j std- 020.? to ?these intersil plastic packaged products employ special material sets, molding compounds and 100% matte tin plate plus anneal (e3) termination finish. these products do contain pb but they are rohs compliant by exemption 7 (lead in high melt temp solder for internal connections) and exemption 5 (lead in piezoelectric elements). these intersil rohs compliant products are compatible with both snpb and pb-free soldering operations. th ese intersil rohs compliant products are msl classified at pb-free peak reflow temper atures that meet or exceed the pb-free requirements of ipc/jedec j std-020.? changed "pb-free" on page 1 and page 3 or dering information: "rohs compliant"
ISL12022M 29 fn6668.9 june 20, 2012 october 26, 2009 fn6668.6 added "default 32.768khz frequency output" fo llowing "interrupt output/frequency output" in irq/fout pi n description. added typical application circuit to page 1. converted to new intersil template updated ordering information by numbering all notes, settin g up links, added msl (moisture sensitivity level) note. updated word "pinout" to "pin configuration". pin descriptions updated to tabular format. added "boldface limits..." text in electrical specification conditions to indicate min and max over-temp. bolded all applicable specs. added ?revision history? and ?products? sections. added table of contents. in features (removed): 1. real time clock 2. customer programmable day light saving 3. combined alarm and fout to "interrupt fo r alarm or 15 selectable frequency outputs". 4. combined battery and vdd monitor to "vdd and battery status monitors". 5. removed oscillator failure detection 6. shortened time stamp for battery to "time stamp for battery switch over". 7. removed all sub-bullets for each feature to save space in applications (removed): 1. medical devices, vending machine, and security system. under thermal information, added theta jc value of 35c/w. as this is special package with offset die, added note 5 to read "for jc , the ?case temp? location is on top of the pack age and measured in the center of the package between pins 6 and 15." july 10, 2009 fn6668.5 the updates clarify the voltage range for the scl and sda pins in the absolu te maximum ratings section and include additional verbiage in the functional description, control an d status registers, and applic ation sections relating to the battery level monitor, low vdd indicator bit (lvdd), low battery indicator bit (lbat85 /lbat75), and battery- backup operation. december 18, 2008 fn6668.4 changed storage temperature on page 5 from: "-65c to +165c" to "-40c to +85c" december 15, 2008 fn6668.3 added spec to datasheet - delta fouti on page 6. added tape and reel reference note to ordering information. december 9, 2008 fn6668.2 updated the following parameters in the spec table on page 5: 1. changed max for idd1@5v from 6.5 to 7, and idd1 @3v from 5.5 to 6. 2. removed ?atlsb (at sensitivity per lsb) from spec table. revision history the revision history provided is for informational purposes only and is believed to be accurate, but not warranted. please go t o web to make sure you have the latest rev. (continued) date revision change
ISL12022M 30 intersil products are manufactured, assembled and tested utilizing iso9000 quality systems as noted in the quality certifications found at www.intersil.com/design/quality intersil products are sold by description only. intersil corporat ion reserves the right to make changes in circuit design, soft ware and/or specifications at any time without notice. accordingly, the reader is cautioned to verify that data sheets are current before placing orders. information furnished by intersil is believed to be accurate and reliable. however, no responsi bility is assumed by intersil or its subsid iaries for its use; nor for any infringem ents of patents or other rights of third parties which may result from its use. no license is granted by implication or otherwise under any patent or patent rights of i ntersil or its subsidiaries. for information regarding intersil corporation and its products, see www.intersil.com fn6668.9 june 20, 2012 for additional products, see www.intersil.com/product_tree products intersil corporation is a leader in the design and manufacture of high-performance analog semico nductors. the company's product s address some of the industry's fastest growing markets, such as , flat panel displays, cell phones, handheld products, and noteb ooks. intersil's product families address power management and analog sign al processing functions. go to www.intersil.com/products for a complete list of intersil product families. for a complete listing of applications, rela ted documentation and related parts, please see the respective device information p age on intersil.com: ISL12022M to report errors or suggestions for this datasheet, please go to www.intersil.com/askourstaff fits are available from our website at http://rel.intersil.com/reports/search.php november 3, 2008 fn6668.1 complete overhaul of data sheet. revised with final specs and text. changes include: added text and equations for ibat for temp sense on , and for relative accuracy for 1m vs 10m interval added text clarifying that no compensation at vbat<2.7v revised entire daylights savings time section added application example for dst added requirement for vbat>1.8v in vbat note. added applications circuit to survive vbat<1.8v corrected all occurrences of alpha tables corrected equations in nppm section bolded and shaded the compensaton registers in table 1 to indicate read only and added note at top of table. added read only statements to iatr, alpha, beta, xt0, alphah fixed blank bits in register tables and in text. register table: change default values for compensati on to xx's, they are different with each device. added datasheet curves add statement to applications section on crystal handling updated pb-free note according to lead finish (order info) removed the "vdd" from the title on the first page global change for vbat and vdd throughout document. made the "bat" and "dd" subscript. included battery reseal function in features and description on page 1 note 3 page 5, lower case "i" as in "inactive" included symbol "temp" for temp sensor accuracy in dc table first paragraph of dst forward registers had incorrect address stated (changed from 15h to 20h) corrected register 20h on page 22; added the dste bit to column 7 eq2, page 19, corrected to "nppm = ippm+alpha(t-xt0)2/4096" february 29, 2008 fn6668.0 initial releas e with fn6668 making this a rev 0. revision history the revision history provided is for informational purposes only and is believed to be accurate, but not warranted. please go t o web to make sure you have the latest rev. (continued) date revision change
ISL12022M 31 fn6668.9 june 20, 2012 package outline drawing m20.3 20 lead wide body small outline plastic package (soic) rev 3, 2/11 7. the lead width as measured 0.36mm (0.14 inch) or greater above the seating plane, shall not exceed a maximum value of 0.61mm detail "x" side view typical recommended land pattern top view 13.00 0.75 0.25 x 45 0.32 0.23 max 8 1.27 0.40 10.65 10.00 7.60 7.40 20 123 index area 2.65 2.35 0.30 max bsc 1.27 0.35 0.49 0.25 (0.10) mc s b m a 0.10 (0.004) 0.25 (0.10) mb m 1 2 1.27 bsc (9.40mm) seating plane (0.60) (2.00) 2 20 3 3 5 7 notes: 1. dimensioning and tolerancing per asme y14.5m-1994. 2. dimension does not include mold flash, protrusions or gate 3. dimension does not include interlead lash or protrusions. interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side. 4. the chamfer on the body is optional. if it is not present, a visual index feature must be located within the crosshatched area. 5. dimension is the length of te rminal for soldering to a substrate. 6. terminal numbers are shown for reference only. 8. controlling dimension: millimeter. 9. dimensions in ( ) for reference only. burrs. mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side. (0.024 inch) 10. jedec reference dr awing number: ms-013-ac. 12.60

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